Fast and Robust Speckle Pattern Authentication by Scale Invariant Feature Transform algorithm in Physical Unclonable Functions
By: Giuseppe Emanuele Lio , Mauro Daniel Luigi Bruno , Francesco Riboli and more
Potential Business Impact:
Makes devices unhackable by using light patterns.
Nowadays, due to the growing phenomenon of forgery in many fields, the interest in developing new anti-counterfeiting device and cryptography keys, based on the Physical Unclonable Functions (PUFs) paradigm, is widely increased. PUFs are physical hardware with an intrinsic, irreproducible disorder that allows for on-demand cryptographic key extraction. Among them, optical PUF are characterized by a large number of degrees of freedom resulting in higher security and higher sensitivity to environmental conditions. While these promising features led to the growth of advanced fabrication strategies and materials for new PUF devices, their combination with robust recognition algorithm remains largely unexplored. In this work, we present a metric-independent authentication approach that leverages the Scale Invariant Feature Transform (SIFT) algorithm to extract unique and invariant features from the speckle patterns generated by optical Physical Unclonable Functions (PUFs). The application of SIFT to the challenge response pairs (CRPs) protocol allows us to correctly authenticate a client while denying any other fraudulent access. In this way, the authentication process is highly reliable even in presence of response rotation, zooming, and cropping that may occur in consecutive PUF interrogations and to which other postprocessing algorithm are highly sensitive. This characteristics together with the speed of the method (tens of microseconds for each operation) broaden the applicability and reliability of PUF to practical high-security authentication or merchandise anti-counterfeiting.
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