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Direct Image Classification from Fourier Ptychographic Microscopy Measurements without Reconstruction

Published: May 8, 2025 | arXiv ID: 2505.05054v2

By: Navya Sonal Agarwal , Jan Philipp Schneider , Kanchana Vaishnavi Gandikota and more

Potential Business Impact:

Lets microscopes see more, faster, without waiting.

Business Areas:
Image Recognition Data and Analytics, Software

The computational imaging technique of Fourier Ptychographic Microscopy (FPM) enables high-resolution imaging with a wide field of view and can serve as an extremely valuable tool, e.g. in the classification of cells in medical applications. However, reconstructing a high-resolution image from tens or even hundreds of measurements is computationally expensive, particularly for a wide field of view. Therefore, in this paper, we investigate the idea of classifying the image content in the FPM measurements directly without performing a reconstruction step first. We show that Convolutional Neural Networks (CNN) can extract meaningful information from measurement sequences, significantly outperforming the classification on a single band-limited image (up to 12 %) while being significantly more efficient than a reconstruction of a high-resolution image. Furthermore, we demonstrate that a learned multiplexing of several raw measurements allows maintaining the classification accuracy while reducing the amount of data (and consequently also the acquisition time) significantly.

Page Count
3 pages

Category
Electrical Engineering and Systems Science:
Image and Video Processing