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DK-Root: A Joint Data-and-Knowledge-Driven Framework for Root Cause Analysis of QoE Degradations in Mobile Networks

Published: November 13, 2025 | arXiv ID: 2511.11737v1

By: Qizhe Li , Haolong Chen , Jiansheng Li and more

BigTech Affiliations: Huawei

Potential Business Impact:

Finds why phone calls or internet are bad.

Business Areas:
Predictive Analytics Artificial Intelligence, Data and Analytics, Software

Diagnosing the root causes of Quality of Experience (QoE) degradations in operational mobile networks is challenging due to complex cross-layer interactions among kernel performance indicators (KPIs) and the scarcity of reliable expert annotations. Although rule-based heuristics can generate labels at scale, they are noisy and coarse-grained, limiting the accuracy of purely data-driven approaches. To address this, we propose DK-Root, a joint data-and-knowledge-driven framework that unifies scalable weak supervision with precise expert guidance for robust root-cause analysis. DK-Root first pretrains an encoder via contrastive representation learning using abundant rule-based labels while explicitly denoising their noise through a supervised contrastive objective. To supply task-faithful data augmentation, we introduce a class-conditional diffusion model that generates KPIs sequences preserving root-cause semantics, and by controlling reverse diffusion steps, it produces weak and strong augmentations that improve intra-class compactness and inter-class separability. Finally, the encoder and the lightweight classifier are jointly fine-tuned with scarce expert-verified labels to sharpen decision boundaries. Extensive experiments on a real-world, operator-grade dataset demonstrate state-of-the-art accuracy, with DK-Root surpassing traditional ML and recent semi-supervised time-series methods. Ablations confirm the necessity of the conditional diffusion augmentation and the pretrain-finetune design, validating both representation quality and classification gains.

Country of Origin
🇨🇳 🇭🇰 Hong Kong, China

Page Count
13 pages

Category
Computer Science:
Machine Learning (CS)